TTK awarded at IEEE VIS!
At IEEE VIS 2017, TTK receives the award for SciVis Best Paper Honorable mention.
Congrats to my co-authors!
TTK exposes topological tools through ParaView, VTK, and dependency-free source code. If you need to robustly analyze your acquired or simulated scientific data, you may want to use TTK. Check out the IEEE Vis Fast Forward video for a preview.
If you’d like to read the actual paper, it is available through IEEE
Finally, if you have questions, need support regarding the usage of TTK, or just want to provide feedback, thanks for sending us an email at email@example.com